Invention Grant
- Patent Title: Low profile current measurement connector
- Patent Title (中): 薄型电流测量连接器
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Application No.: US14179300Application Date: 2014-02-12
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Publication No.: US09250272B2Publication Date: 2016-02-02
- Inventor: David R. Pasternak
- Applicant: NATIONAL INSTRUMENTS CORPORATION
- Applicant Address: US TX Austin
- Assignee: National Instruments Corporation
- Current Assignee: National Instruments Corporation
- Current Assignee Address: US TX Austin
- Agency: Meyertons Hood Kivlin Kowert & Goetzel, P.C.
- Agent Jeffrey C. Hood; Brian E. Moore
- Main IPC: G01R19/00
- IPC: G01R19/00 ; G01R1/44 ; G01R15/18

Abstract:
A current measurement connector may include a first part and a second part. Each part may include a mount and a joint. The first and second part may be joined via the respective joints through a current transformer interposed between the first and second parts. The respective mounts may be configured to receive a current from a current source and pass the received current through the current transformer via the first and second parts inducing a current in the current transformer. The induced current may be useable to measure the current from the current source. Methods for fabricating the current measurement connector may include die casting the first and second parts and press fitting the first and second parts at the respective joints through the current transformer. Methods for use may include withstanding a fault current pulse and dissipating heat associated with the pulse via the first and second parts.
Public/Granted literature
- US20150226771A1 Low Profile Current Measurement Connector Public/Granted day:2015-08-13
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