Invention Grant
- Patent Title: Phase filters for a scanning microscope
- Patent Title (中): 扫描显微镜的相位滤波器
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Application No.: US13486652Application Date: 2012-06-01
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Publication No.: US09250429B2Publication Date: 2016-02-02
- Inventor: Hilmar Gugel , Arnold Giske , Marcus Dyba , Roland Seifert , Bernd Widzgowski
- Applicant: Hilmar Gugel , Arnold Giske , Marcus Dyba , Roland Seifert , Bernd Widzgowski
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Patentbar International, P.C.
- Priority: DE102009056250 20091201
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B5/22 ; G02B21/24

Abstract:
An optical device includes: a focusing optic that focuses a light beam in a focal plane; at least two phase filters for selectively focusing the light beam and effecting a phase shift of the light beam; and a filter wheel supporting the at least two phase filters which are individually introducible along an optical axis of the light beam, where the filter wheel is rotationally adjusted in relation to the optical axis by a stepper motor and linearly adjusted in an r-direction along a plane of the filter wheel by a linear adjustment mechanism.
Public/Granted literature
- US20120236398A1 Phase Filters for a Scanning Microscope Public/Granted day:2012-09-20
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