Invention Grant
- Patent Title: Buried trench isolation in integrated circuits
- Patent Title (中): 集成电路中的埋沟沟隔离
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Application No.: US14207303Application Date: 2014-03-12
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Publication No.: US09252026B2Publication Date: 2016-02-02
- Inventor: Rinji Sugino , Lei Xue , Ching-Huang Lu , Simon Chan
- Applicant: Spansion LLC
- Applicant Address: US CA San Jose
- Assignee: Cypress Semiconductor Corporation
- Current Assignee: Cypress Semiconductor Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: H01L21/76
- IPC: H01L21/76 ; H01L21/324 ; H01L21/764 ; H01L21/762 ; H01L29/06

Abstract:
A system and method for providing electrical isolation between closely spaced devices in a high density integrated circuit (IC) are disclosed herein. An integrated circuit (IC) comprising a substrate, a first device, a second device, and a buried trench in the substrate and a method of fabricating the same are also discussed. The buried trench is positioned between first and second devices and may be filled with dielectric material. Alternatively, the buried trench contains air. A method of using Hydrogen annealing to create the buried trench is disclosed.
Public/Granted literature
- US20150262838A1 Buried Trench Isolation in Integrated Circuits Public/Granted day:2015-09-17
Information query
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