Invention Grant
- Patent Title: Ambient infrared detection in solid state sensors
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Application No.: US14063069Application Date: 2013-10-25
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Publication No.: US09252176B2Publication Date: 2016-02-02
- Inventor: Ilia Ovsiannikov , Xuemei Zhang , Dmitri Jerdev
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: H01L27/146
- IPC: H01L27/146 ; G03B13/02

Abstract:
A solid state imaging device includes an array of active pixels and an infrared cut filter formed over the sensor. Optionally, a slot in the infrared cut filter allows infrared illumination to reach the sensor to be detected by pixels covered by a visually opaque filter and surrounded by pixels of special types that limit charge leakage and enable high dynamic range sensing of infrared illumination. A ratio of average infrared signal to average brightness indicates an amount of infrared illumination reaching the imaging device.
Public/Granted literature
- US20140048691A1 AMBIENT INFRARED DETECTION IN SOLID STATE SENSORS Public/Granted day:2014-02-20
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