Invention Grant
US09252375B2 Method of fabricating a light emitting diode display with integrated defect detection test
有权
制造具有集成缺陷检测测试的发光二极管显示器的方法
- Patent Title: Method of fabricating a light emitting diode display with integrated defect detection test
- Patent Title (中): 制造具有集成缺陷检测测试的发光二极管显示器的方法
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Application No.: US13842925Application Date: 2013-03-15
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Publication No.: US09252375B2Publication Date: 2016-02-02
- Inventor: Andreas Bibl , Kapil V. Sakariya , Charles R. Griggs , James Michael Perkins
- Applicant: LuxVue Technology Corporation
- Applicant Address: US CA Santa Clara
- Assignee: LuxVue Technology Corporation
- Current Assignee: LuxVue Technology Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Blakely, Sokoloff, Taylor & Zafman LLP
- Main IPC: H01L51/50
- IPC: H01L51/50 ; G09G3/00 ; H01L23/00 ; H01L21/683
Abstract:
A display panel and method of manufacture are described. In an embodiment, a display substrate includes a pixel area and a non-pixel area. An array of subpixels and corresponding array of bottom electrodes are in the pixel area. An array of micro LED devices are bonded to the array of bottom electrodes. One or more top electrode layers are formed in electrical contact with the array of micro LED devices. In one embodiment a redundant pair of micro LED devices are bonded to the array of bottom electrodes. In one embodiment, the array of micro LED devices are imaged to detect irregularities.
Public/Granted literature
- US20140267683A1 METHOD OF FABRICATING A LIGHT EMITTING DIODE DISPLAY WITH INTEGRATED DEFECT DETECTION TEST Public/Granted day:2014-09-18
Information query
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