Invention Grant
- Patent Title: Scan flip-flop, method thereof and devices having the same
- Patent Title (中): 扫描触发器,其方法和具有该触发器的装置
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Application No.: US13624492Application Date: 2012-09-21
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Publication No.: US09252754B2Publication Date: 2016-02-02
- Inventor: Min Su Kim
- Applicant: Min Su Kim
- Applicant Address: KR Suwon-si
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Suwon-si
- Agency: Sughrue Mion, PLLC
- Priority: KR10-2012-0027387 20120316
- Main IPC: H03K3/00
- IPC: H03K3/00 ; H03K3/356 ; G01R31/3185

Abstract:
A scan flip-flop, which performs a normal operation latching a data input and a scan operation latching a scan input, includes a first circuit, a second circuit and a latch. The first circuit determines a voltage of an intermediate node based on a clock signal, one of the data input and the scan input, and data of a latch input node. The second circuit determines the data based on the clock signal, the voltage of the intermediate node and the data input during the normal operation, and determines the data based on the clock signal and the voltage of the intermediate node during the scan operation. The latch latches the data based on the clock signal.
Public/Granted literature
- US20130241617A1 SCAN FLIP-FLOP, METHOD THEREOF AND DEVICES HAVING THE SAME Public/Granted day:2013-09-19
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