Invention Grant
US09252788B1 Phase error detection in phase lock loop and delay lock loop devices
有权
锁相环和延迟锁环设备中的相位误差检测
- Patent Title: Phase error detection in phase lock loop and delay lock loop devices
- Patent Title (中): 锁相环和延迟锁环设备中的相位误差检测
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Application No.: US14483565Application Date: 2014-09-11
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Publication No.: US09252788B1Publication Date: 2016-02-02
- Inventor: John W. Stanton , Pradeep Thiagarajan
- Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Roberts Mlotkowski Safran & Cole, P.C.
- Agent Steven Meyers
- Main IPC: G01R25/00
- IPC: G01R25/00 ; H03L7/095
Abstract:
A device includes a lock detect circuit that is structured and arranged to: convert a reference clock to a reference triangle wave; convert a feedback clock to a feedback triangle wave; determine whether the feedback triangle wave is within a tolerance margin that is defined relative to the reference triangle wave; and generate a determiner output that is a first value when the feedback triangle wave is not within the tolerance margin, and a second value when the feedback triangle wave is within the tolerance margin.
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