Invention Grant
- Patent Title: Multiple parameter fault detection in electrosurgical instrument shields
- Patent Title (中): 电外科仪器屏蔽多参数故障检测
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Application No.: US13786670Application Date: 2013-03-06
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Publication No.: US09254165B2Publication Date: 2016-02-09
- Inventor: Kurt Albert Aronow , David Newton , Don R. Boyle
- Applicant: Encision, Inc.
- Applicant Address: US CO Boulder
- Assignee: ENCISION, INC.
- Current Assignee: ENCISION, INC.
- Current Assignee Address: US CO Boulder
- Agency: Neugeboren O'Dowd PC
- Main IPC: A61B18/12
- IPC: A61B18/12 ; A61B18/16 ; A61B18/00
Abstract:
A system and method for detecting faults within an electrosurgical instrument having a shield and an active electrode uses multiple possible fault conditions. In one embodiment the monitoring system comprises an electrosurgical generator coupled to the electrosurgical instrument and adapted to deliver power to the active electrode of the electrosurgical instrument, monitoring circuitry coupled to the electrosurgical generator and the electrosurgical instrument.
Public/Granted literature
- US20130253502A1 Multiple Parameter Fault Detection in Electrosurgical Instrument Shields Public/Granted day:2013-09-26
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