Invention Grant
- Patent Title: Ionization probe
- Patent Title (中): 电离探针
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Application No.: US14318998Application Date: 2014-06-30
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Publication No.: US09254497B2Publication Date: 2016-02-09
- Inventor: Tomohito Nakano
- Applicant: SHIMADZU CORPORATION
- Applicant Address: JP Kyoto
- Assignee: SHIMADZU CORPORATION
- Current Assignee: SHIMADZU CORPORATION
- Current Assignee Address: JP Kyoto
- Agency: Sughrue Mion, PLLC
- Priority: JP2013-179374 20130830
- Main IPC: H01J49/26
- IPC: H01J49/26 ; B05B9/00

Abstract:
In the ionization probe, an assist gas nozzle, coaxial with a nozzle, is provided around a nozzle that discharges a liquid sample. A housing inside which is formed an annular assist gas channel is provided around the assist gas nozzle. A gas inlet for introducing gas into the assist gas heating channel and gas outlet for feeding gas from channel to assist gas nozzle are provided at opposite locations across the center of the channel. Gas introduced into the assist gas heating channel is heated by a substantially annular heater, and high temperature gas is discharged through gas discharge hole of the assist gas nozzle. The heater and the channel through which high temperature gas flows are arranged solely at the tip part of the ionization probe, so thermal insulation of the probe base part can be easily accomplished.
Public/Granted literature
- US20150060566A1 IONIZATION PROBE Public/Granted day:2015-03-05
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