Invention Grant
- Patent Title: Surface plasmon-enhanced fluorescence measuring apparatus
- Patent Title (中): 表面等离子体增强荧光测定装置
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Application No.: US13499760Application Date: 2010-09-25
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Publication No.: US09255883B2Publication Date: 2016-02-09
- Inventor: Masataka Matsuo , Yukito Nakamura , Naoki Hikage
- Applicant: Masataka Matsuo , Yukito Nakamura , Naoki Hikage
- Applicant Address: JP
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP
- Agency: Cantor Colburn LLP
- Priority: JP2009-231226 20091005
- International Application: PCT/JP2010/066609 WO 20100925
- International Announcement: WO2011/043202 WO 20110414
- Main IPC: G02B26/10
- IPC: G02B26/10 ; G02B26/00 ; G01N21/55 ; G01N21/552 ; G01N21/64 ; G01N21/89
Abstract:
Provided is an apparatus having a beam geometry changing device that changes the beam geometry of excitation light, and a control device that controls the beam geometry changing device, with favorable precision, which the apparatus performs a resonance angle scan and to detect a target material.
Public/Granted literature
- US20120201716A1 SURFACE PLASMON-ENHANCED FLUORESCENCE MEASURING APPARATUS Public/Granted day:2012-08-09
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