Invention Grant
- Patent Title: Non-destructive inspection method and device
- Patent Title (中): 无损检测方法及装置
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Application No.: US13501468Application Date: 2010-10-13
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Publication No.: US09255899B2Publication Date: 2016-02-09
- Inventor: Hiroyuki Nose , Hajime Kuwabara , Tetsuya Kobayashi
- Applicant: Hiroyuki Nose , Hajime Kuwabara , Tetsuya Kobayashi
- Applicant Address: JP Tokyo
- Assignee: IHI Corporation
- Current Assignee: IHI Corporation
- Current Assignee Address: JP Tokyo
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Priority: JP2009-238317 20091015
- International Application: PCT/JP2010/067973 WO 20101013
- International Announcement: WO2011/046148 WO 20110421
- Main IPC: G01N23/22
- IPC: G01N23/22 ; G01N23/222

Abstract:
A method of non-destructive inspection of a subject body including an element is comprised of irradiating the subject body with a neutron ray through a first measurement point and a second measurement point; measuring an elapsed time after a first time point when a resonant neutron specific to the element passes through the first measurement point and before a second time point when a prompt gamma ray made emitted by the resonant neutron from the subject body is detected at the second measurement point; and determining a location of the element in the subject body by the first measurement point, the second measurement point, a relative position toward a surface of the subject body, and the elapsed time.
Public/Granted literature
- US20120199746A1 NON-DESTRUCTIVE INSPECTION METHOD AND DEVICE Public/Granted day:2012-08-09
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