Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US13809280Application Date: 2011-07-20
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Publication No.: US09255937B2Publication Date: 2016-02-09
- Inventor: Yukinori Sakashita , Katsuaki Takahashi , Yoshihiro Yamashita , Taku Sakazume
- Applicant: Yukinori Sakashita , Katsuaki Takahashi , Yoshihiro Yamashita , Taku Sakazume
- Applicant Address: JP Tokyo
- Assignee: HITACHI HIGH TECHNOLOGIES CORPORATION
- Current Assignee: HITACHI HIGH TECHNOLOGIES CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2010-162414 20100720
- International Application: PCT/JP2011/066403 WO 20110720
- International Announcement: WO2012/011481 WO 20120126
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/10 ; G01N35/04

Abstract:
Provided is an automatic analyzer that includes a suction nozzle, a detection container, and a detector. The suction nozzle suctions a sample and a solution used for the detection of the sample. The suctioned sample and the solution are supplied to the detection container. The detector detects a signal from the sample. In addition, a vessel for the sample and a container for the solution are disposed below the detection container.
Public/Granted literature
- US20130125671A1 AUTOMATIC ANALYZER Public/Granted day:2013-05-23
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