Invention Grant
- Patent Title: Sample analyzer and method of analyzing a sample
- Patent Title (中): 样品分析仪和样品分析方法
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Application No.: US13732967Application Date: 2013-01-02
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Publication No.: US09255938B2Publication Date: 2016-02-09
- Inventor: Toru Mizumoto , Keisuke Tsutsumida , Takayoshi Izumi , Koji Fujimoto , Shinya Nakajima
- Applicant: Sysmex Corporation , Arkray, Inc.
- Applicant Address: JP Hyogo
- Assignee: SYSMEX CORPORATION
- Current Assignee: SYSMEX CORPORATION
- Current Assignee Address: JP Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2010-152530 20100702
- Main IPC: G01N35/02
- IPC: G01N35/02 ; G01N35/10 ; G01N35/00

Abstract:
A sample analyzer includes a first measurement unit, a second measurement unit, a detection section which detects information about an amount of a sample in a sample container before the first measurement unit aspirates the sample in the sample container, and a control section. Based on a detection result by the detection section and based on information about a predetermined sample amount necessary for performing both in the first measurement unit and the second measurement unit, when the control section has determined that the amount of the sample in the sample container is insufficient for the predetermined sample amount, the control section controls the first measurement unit and the second measurement unit so as not to aspirate the sample in the sample container.
Public/Granted literature
- US20130111978A1 SAMPLE ANALYZER AND METHOD OF ANALYZING A SAMPLE Public/Granted day:2013-05-09
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