Invention Grant
- Patent Title: Potentiometer degradation evaluating method
- Patent Title (中): 电位器劣化评估方法
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Application No.: US13785562Application Date: 2013-03-05
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Publication No.: US09255951B2Publication Date: 2016-02-09
- Inventor: Makoto Saruwatari , Hiroaki Narita , Takuji Abe
- Applicant: Azbil Corporation
- Applicant Address: JP Tokyo
- Assignee: AZBIL CORPORATION
- Current Assignee: AZBIL CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Troutman Sanders LLP
- Priority: JP2012-048483 20120305
- Main IPC: G01R27/14
- IPC: G01R27/14 ; G01R35/00 ; G01R31/28 ; G01R31/02 ; G01D5/165

Abstract:
In a method for evaluating degradation of a potentiometer, a plurality of evaluation items, from minor to major, are established as evaluation items for degradation in performance prior to failure of a potentiometer. The degradation of the potentiometer in performance of the plurality of evaluation items is evaluated in terms of stages, in a specific sequence.
Public/Granted literature
- US20130229195A1 POTENTIOMETER DEGRADATION EVALUATING METHOD Public/Granted day:2013-09-05
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