Invention Grant
- Patent Title: Built-in self-test circuit for voltage controlled oscillator
- Patent Title (中): 用于压控振荡器的内置自测电路
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Application No.: US14252886Application Date: 2014-04-15
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Publication No.: US09255963B2Publication Date: 2016-02-09
- Inventor: Hsieh-Hung Hsieh , Ming Hsien Tsai , Tzu-Jin Yeh , Chewn-Pu Jou , Fu-Lung Hsueh
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H03B5/12
- IPC: H03B5/12 ; G01R31/28 ; H03L5/00
Abstract:
A device comprises a radio frequency peak detector configured to receive an ac signal from a voltage controlled oscillator and generate a dc value proportional to the ac signal at an output of the radio frequency peak detector and a feedback control unit coupled between an output of the radio frequency peak detector and an input of the voltage controlled oscillator.
Public/Granted literature
- US20140225676A1 Built-in Self-test Circuit for Voltage Controlled Oscillator Public/Granted day:2014-08-14
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