Invention Grant
- Patent Title: Integrated circuit with a high-speed debug access port
- Patent Title (中): 集成电路具有高速调试访问端口
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Application No.: US14087690Application Date: 2013-11-22
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Publication No.: US09255968B2Publication Date: 2016-02-09
- Inventor: Christopher D. Finan
- Applicant: Altera Corporation
- Applicant Address: US CA San Jose
- Assignee: Altera Corporation
- Current Assignee: Altera Corporation
- Current Assignee Address: US CA San Jose
- Main IPC: G01R31/3185
- IPC: G01R31/3185 ; G01R31/317

Abstract:
An integrated circuit with a high-speed debug access port includes interface circuitry and a dedicated debug port in the interface circuitry. The interface circuitry includes a function circuit block that is used to receive a data packet from external circuitry coupled to the integrated circuit. The dedicated debug port is coupled to the function circuit block and is used to transmit the received data packet to debug circuitry on the integrated circuit. The interface circuitry may include a peripheral component interconnect express (PCIe) interface circuit.
Public/Granted literature
- US20150149843A1 INTEGRATED CIRCUIT WITH A HIGH-SPEED DEBUG ACCESS PORT Public/Granted day:2015-05-28
Information query
IPC分类: