Invention Grant
US09255968B2 Integrated circuit with a high-speed debug access port 有权
集成电路具有高速调试访问端口

Integrated circuit with a high-speed debug access port
Abstract:
An integrated circuit with a high-speed debug access port includes interface circuitry and a dedicated debug port in the interface circuitry. The interface circuitry includes a function circuit block that is used to receive a data packet from external circuitry coupled to the integrated circuit. The dedicated debug port is coupled to the function circuit block and is used to transmit the received data packet to debug circuitry on the integrated circuit. The interface circuitry may include a peripheral component interconnect express (PCIe) interface circuit.
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