Invention Grant
- Patent Title: Monomer, polymer, resist composition, and patterning process
- Patent Title (中): 单体,聚合物,抗蚀剂组合物和图案化工艺
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Application No.: US14697901Application Date: 2015-04-28
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Publication No.: US09256127B2Publication Date: 2016-02-09
- Inventor: Masayoshi Sagehashi , Takayuki Fujiwara , Koji Hasegawa , Ryosuke Taniguchi
- Applicant: Shin-Etsu Chemical Co., Ltd.
- Applicant Address: JP Tokyo
- Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee: SHIN-ETSU CHEMICAL CO., LTD.
- Current Assignee Address: JP Tokyo
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- Priority: JP2014-097347 20140509
- Main IPC: C08F24/00
- IPC: C08F24/00 ; C08F28/06 ; G03F7/039 ; G03F7/32 ; G03F7/004 ; G03F7/30 ; G03F7/20 ; C07D307/83 ; C07D307/935 ; C07D493/04 ; C07D495/04 ; C08F224/00 ; C08F228/06

Abstract:
A polymer for resist use is obtainable from a monomer having formula (1) wherein R1 is H, CH3 or CF3, R2 and R3 each are H or a monovalent hydrocarbon group, X1 is a divalent hydrocarbon group, k1=0 or 1, and Z forms a 5 or 6-membered alicyclic ring. A resist composition comprising the polymer is shelf stable and displays a high dissolution contrast, controlled acid diffusion and low roughness during both alkaline development and organic solvent development.
Public/Granted literature
- US20150323865A1 MONOMER, POLYMER, RESIST COMPOSITION, AND PATTERNING PROCESS Public/Granted day:2015-11-12
Information query
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