Invention Grant
- Patent Title: Synchronized debug information generation
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Application No.: US14066722Application Date: 2013-10-30
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Publication No.: US09256489B2Publication Date: 2016-02-09
- Inventor: Ajay K. Mahajan , Venkatesh Sainath , Vishwanatha Subbanna
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Maeve McCarthy
- Main IPC: G06F11/07
- IPC: G06F11/07

Abstract:
In an approach for determining a location of failure between interconnects/controller, a computer collects debug information simultaneously at a plurality of nodes coupled to an interconnect. Subsequent to collecting debug information, the computer analyzes the debug information collected simultaneously thereby determining which end of the interconnect caused the failure.
Public/Granted literature
- US20150121144A1 SYNCHRONIZED DEBUG INFORMATION GENERATION Public/Granted day:2015-04-30
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