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US09256504B2 Semiconductor integrated circuit including a state machine 有权
半导体集成电路包括状态机

Semiconductor integrated circuit including a state machine
Abstract:
A state machine; a BIST circuit including a test pattern generator and an expected value comparison circuit; a state monitoring circuit configured to monitor whether or not a state of the state machine is a specific state; and a transition request detection circuit configured to detect a transition request signal from the specific state to a next state, are held. When the state monitoring circuit decides that the state of the state machine is the specific state, the state machine outputs a signal indicating the specific state as a state output of the state machine, and the BIST circuit performs a test of the state machine. When the transition request detection circuit detects the transition request signal while the test is performed, the BIST circuit stops the test of the state machine.
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