Invention Grant
US09256938B2 Characteristic X-ray escape correction in photon-counting detectors
有权
光子计数检测器中的特征X射线逃逸校正
- Patent Title: Characteristic X-ray escape correction in photon-counting detectors
- Patent Title (中): 光子计数检测器中的特征X射线逃逸校正
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Application No.: US14190170Application Date: 2014-02-26
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Publication No.: US09256938B2Publication Date: 2016-02-09
- Inventor: Adam Petschke , Yu Zou
- Applicant: KABUSHIKI KAISHA TOSHIBA , Toshiba Medical Systems Corporation
- Applicant Address: JP Minato-ku JP Otawara-shi
- Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA MEDICAL SYSTEMS CORPORATION
- Current Assignee: KABUSHIKI KAISHA TOSHIBA,TOSHIBA MEDICAL SYSTEMS CORPORATION
- Current Assignee Address: JP Minato-ku JP Otawara-shi
- Agency: Oblon, McClelland, Maier & Neustadt, L.L.P.
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G06T5/00 ; G06K9/52

Abstract:
A method and an apparatus for determining primary and secondary escape probabilities for a large photon-counting detector without pile-up. A model for the detector with no pile-up is formulated and used for spectrum correction in a computed tomography scanner. The method includes computing primary K-escape and secondary K-escape probabilities occurring at a certain depth within the photon-counting detector. Further, a no pile-up model for the photon-counting detector is formulated by determining a response function, based on the computed primary and secondary K-escape probabilities and geometry of the photon-counting detector. The method includes obtaining a measured CT scan of an object and further performs spectrum correction by determining the incident input spectrum based on the response function and the measured spectrum of the large photon-counting detector.
Public/Granted literature
- US20150243022A1 CHARACTERISTIC X-RAY ESCAPE CORRECTION IN PHOTON-COUNTING DETECTORS Public/Granted day:2015-08-27
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