A method and an apparatus for testing a memory are provided, where the memory includes a plurality of sectors each of which includes a plurality of bytes, and the testing is performed to the memory byte by byte. The method includes: during the testing, once a first byte in a first sector fails the testing, stopping testing the rest bytes in the first sector which haven't been tested, and skipping the testing to a second byte in a second sector. Accordingly, if one byte of the first sector fails the testing, the testing will be skipped to a second sector, and the remained bytes of the first sector will not be tested any more, and other testing items will not be implemented to the first sector within the whole testing flow. Therefore, redundant testing steps can be avoided and testing efficiency can be improved.