Invention Grant
- Patent Title: Apparatus and method for determining defect pixel
- Patent Title (中): 用于确定缺陷像素的装置和方法
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Application No.: US14010978Application Date: 2013-08-27
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Publication No.: US09258555B2Publication Date: 2016-02-09
- Inventor: Takeru Tsuzuki
- Applicant: HANWHA TECHWIN CO.,LTD.
- Applicant Address: KR Changwon-si
- Assignee: Hanwha Techwin Co., Ltd.
- Current Assignee: Hanwha Techwin Co., Ltd.
- Current Assignee Address: KR Changwon-si
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-188468 20120829; KR10-2013-0059927 20130527
- Main IPC: H04N17/00
- IPC: H04N17/00 ; H04N5/367

Abstract:
Provided is an apparatus of determining a defect pixel which includes at least one of a first edge periphery defect determiner and a second edge periphery defect determiner, wherein the first edge periphery defect determiner is configured to determine if a central pixel of a pixel group is the defect pixel by using pixel values of pixels adjacent to the central pixel disposed close to an image edge, wherein the edge includes at least one of right, left, upper, lower, lower-left, lower-right, upper-left and upper-right pixels of the central pixel, and wherein the second edge periphery defect determiner is configured to determine if the central pixel is the defect pixel by using a pixel disposed at at least one of the lower-left, lower-right, upper-left and upper-right of the central pixel.
Public/Granted literature
- US20140063266A1 APPARATUS AND METHOD FOR DETERMINING DEFECT PIXEL Public/Granted day:2014-03-06
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