Invention Grant
- Patent Title: On-chip voltage generation for a programmable memory device
- Patent Title (中): 可编程存储器件的片内电压产生
-
Application No.: US14250413Application Date: 2014-04-11
-
Publication No.: US09263097B2Publication Date: 2016-02-16
- Inventor: Horst Knoedgen
- Applicant: Dialog Semiconductor GmbH
- Applicant Address: DE Kirchheim/Teck-Nabern
- Assignee: Dialog Semiconductor GmbH
- Current Assignee: Dialog Semiconductor GmbH
- Current Assignee Address: DE Kirchheim/Teck-Nabern
- Agency: Saile Ackerman LLC
- Agent Stephen B. Ackerman
- Priority: EP13184783 20130917
- Main IPC: G11C5/14
- IPC: G11C5/14 ; G11C17/16 ; G11C17/18 ; G11C17/00

Abstract:
The programming of programmable memory devices, e.g. one-time programmable (OTP) memory device is presented. In particular, efficient methods and systems for generating the supply voltage for programming a programmable memory device are described. A controller configured to control the programming of a data word into a programmable memory device is described. The controller is configured to set one or more digital control signals for programming the data word into the programmable memory device. Furthermore, the controller is configured to, subsequent to setting the one or more digital control signals, increasing a device supply voltage for the programmable memory device from a default operation level to a programming level.
Public/Granted literature
- US20150078059A1 On-Chip Voltage Generation for a Programmable Memory Device Public/Granted day:2015-03-19
Information query