Invention Grant
- Patent Title: Accelerated life testing device and method
- Patent Title (中): 加速寿命试验装置及方法
-
Application No.: US14086750Application Date: 2013-11-21
-
Publication No.: US09267875B2Publication Date: 2016-02-23
- Inventor: Darren Y. K. Yap , Alexander E. Holmes
- Applicant: Medtronic MiniMed, Inc.
- Applicant Address: US CA Northridge
- Assignee: MEDTRONIC MINIMED, INC.
- Current Assignee: MEDTRONIC MINIMED, INC.
- Current Assignee Address: US CA Northridge
- Agency: Medtronic Minimed, Inc.
- Main IPC: G01N17/00
- IPC: G01N17/00 ; G01M99/00 ; G01N25/68
Abstract:
An accelerated life testing device and method including an accelerated life testing method for a test piece within a test chamber, the method including: establishing a first atmosphere within the test chamber; changing the first atmosphere to a second atmosphere to form a deposition layer on the test piece; changing the second atmosphere to the first atmosphere to remove the deposition layer from the test piece; and repeating the changing the first atmosphere to the second atmosphere and the changing the second atmosphere to the first atmosphere to form an oxidation layer on the test piece.
Public/Granted literature
- US20150135862A1 ACCELERATED LIFE TESTING DEVICE AND METHOD Public/Granted day:2015-05-21
Information query
