Invention Grant
- Patent Title: Test platform
- Patent Title (中): 测试平台
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Application No.: US14093055Application Date: 2013-11-29
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Publication No.: US09267966B2Publication Date: 2016-02-23
- Inventor: Yong-Sheng Yang
- Applicant: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD. , HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD.,HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN2013105779370 20131119
- Main IPC: G01R1/04
- IPC: G01R1/04 ; G01R31/00 ; G01R31/302

Abstract:
A test platform includes a base, a supporting member rotatably supported on the base, a laser emitter mounted on the base, and a laser receiver mounted to the supporting member and aligning with the laser emitter. The supporting member includes a network socket electrically connected to the laser receiver. The laser emitter is electrically connected to a network communication device.
Public/Granted literature
- US20150137847A1 TEST PLATFORM Public/Granted day:2015-05-21
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