Invention Grant
- Patent Title: Capacitance evaluation apparatuses and methods
- Patent Title (中): 电容评估装置及方法
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Application No.: US13210264Application Date: 2011-08-15
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Publication No.: US09267980B2Publication Date: 2016-02-23
- Inventor: Xinwei Guo , James I. Esteves , Arvind Muralidharan , Nicholas Hendrickson
- Applicant: Xinwei Guo , James I. Esteves , Arvind Muralidharan , Nicholas Hendrickson
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dorsey & Whitney LLP
- Main IPC: G01R31/12
- IPC: G01R31/12 ; G01R31/08 ; G01R31/02 ; G11C29/02 ; G11C29/50

Abstract:
Apparatus and methods for evaluating leakage currents of capacitances are described. Capacitances having excessive leakage currents may be disabled from use. An example apparatus includes a leakage detection circuit configured to be coupled to a capacitance block. The leakage detection circuit is configured to determine whether a leakage current of a capacitance of the capacitance block exceeds a current limit and is further configured to provide an output indicative of a status of the capacitance. A detection controller is coupled to the leakage detection circuit and a register, and the detection controller is configured to store data in the register indicative of the status of the capacitance based at least in part on the signal from the leakage detection circuit.
Public/Granted literature
- US20130043889A1 CAPACITANCE EVALUATION APPARATUSES AND METHODS Public/Granted day:2013-02-21
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