Invention Grant
- Patent Title: Near-field millimeter wave imaging
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Application No.: US13545437Application Date: 2012-07-10
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Publication No.: US09268017B2Publication Date: 2016-02-23
- Inventor: Aydin Babakhani , Duixian Liu , Scott K. Reynolds , Mihai A. Sanduleanu
- Applicant: Aydin Babakhani , Duixian Liu , Scott K. Reynolds , Mihai A. Sanduleanu
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Ryan, Mason & Lewis, LLP
- Agent Anne V. Dougherty
- Main IPC: G01S13/89
- IPC: G01S13/89 ; H01Q1/22 ; H01Q7/00 ; H01Q21/06
Abstract:
Systems and method for near-field millimeter wave imaging are provided, in particular, near-field millimeter wave imaging systems and methods that enable sub-wavelength resolution imaging by scanning objects with sub-wavelength probe elements and capturing and measuring phase and intensity of reflected energy to generate images.
Public/Granted literature
- US20130027243A1 NEAR-FIELD MILLIMETER WAVE IMAGING Public/Granted day:2013-01-31
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