Invention Grant
- Patent Title: Inspection area setting method for image inspecting device
- Patent Title (中): 图像检查装置检查区域设定方法
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Application No.: US14363340Application Date: 2012-08-29
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Publication No.: US09269134B2Publication Date: 2016-02-23
- Inventor: Yoshihisa Minato , Yukiko Yanagawa
- Applicant: Yoshihisa Minato , Yukiko Yanagawa
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: Osha Liang LLP
- Priority: JP2012-000588 20120105
- International Application: PCT/JP2012/071758 WO 20120829
- International Announcement: WO2013/103032 WO 20130711
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01N21/88

Abstract:
An inspection area setting method for setting inspection area-defining information defining an inspection area to an image inspecting device, the image inspecting device being configured to extract a portion constituting the inspection area as an inspection area image from an original image obtained by taking an image of an inspection object, and to inspect the inspection object by analyzing the inspection area image, includes an acquisition step of acquiring a sample image obtained by taking an image of a sample of the inspection object, an inspection area searching step, and a setting step.
Public/Granted literature
- US20140314302A1 INSPECTION AREA SETTING METHOD FOR IMAGE INSPECTING DEVICE Public/Granted day:2014-10-23
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