Invention Grant
US09269134B2 Inspection area setting method for image inspecting device 有权
图像检查装置检查区域设定方法

Inspection area setting method for image inspecting device
Abstract:
An inspection area setting method for setting inspection area-defining information defining an inspection area to an image inspecting device, the image inspecting device being configured to extract a portion constituting the inspection area as an inspection area image from an original image obtained by taking an image of an inspection object, and to inspect the inspection object by analyzing the inspection area image, includes an acquisition step of acquiring a sample image obtained by taking an image of a sample of the inspection object, an inspection area searching step, and a setting step.
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