Invention Grant
- Patent Title: Arrangement and method for inverse X-ray phase contrast imaging
- Patent Title (中): 反相X射线相位成像的布置和方法
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Application No.: US13959527Application Date: 2013-08-05
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Publication No.: US09269469B2Publication Date: 2016-02-23
- Inventor: Gabriele Suft
- Applicant: Gabriele Suft
- Applicant Address: DE München
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE München
- Agency: Lempia Summerfield Katz LLC
- Priority: DE102012213876 20120806
- Main IPC: G01N1/06
- IPC: G01N1/06 ; G21K1/06 ; G21K1/02

Abstract:
An arrangement for inverse x-ray phase contrast imaging includes a photon-counting x-ray detector and a multibeam x-ray tube. Focal points of the x-ray tube are collimated such that a narrow x-ray beam that is directed toward an optical axis of the arrangement and toward the x-ray detector may be generated. An active surface of the x-ray detector is at least as large as a cross-sectional surface of the narrow x-ray beam. The arrangement also includes a source grating arranged between the x-ray tube and the x-ray detector. The arrangement includes a defraction grating arranged between the source grating and the x-ray detector, and an absorption grating arranged between the defraction grating and the x-ray detector.
Public/Granted literature
- US20140037059A1 Arrangement and Method for Inverse X-Ray Phase Contrast Imaging Public/Granted day:2014-02-06
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