Invention Grant
US09273337B2 Method for improving measurement accuracy and devices and systems related thereto 有权
提高测量精度的方法及其相关的装置和系统

Method for improving measurement accuracy and devices and systems related thereto
Abstract:
The present disclosure relates to methods and devices for providing accurate measurement of a property of a sample. The method comprises obtaining a plurality of independent measurements of the property. The plurality of values of the property of the sample obtained by the plurality of independent measurements is compared to determine whether one or more of the values is an outlier.
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