Invention Grant
- Patent Title: Contact-type infrared temperature sensor for high temperature measurement, thermal apparatus, and exhaust system
- Patent Title (中): 用于高温测量的接触式红外温度传感器,热敏设备和排气系统
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Application No.: US14418446Application Date: 2013-07-23
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Publication No.: US09273586B2Publication Date: 2016-03-01
- Inventor: Toshiyuki Nojiri
- Applicant: SEMITEC CORPORATION
- Applicant Address: JP Tokyo
- Assignee: SEMITEC CORPORATION
- Current Assignee: SEMITEC CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: Jianq Chyun IP Office
- Priority: JP2012-172868 20120803
- International Application: PCT/JP2013/069890 WO 20130723
- International Announcement: WO2014/021140 WO 20140206
- Main IPC: G01J5/20
- IPC: G01J5/20 ; F01N11/00 ; G01J5/00 ; G01J5/08 ; F02D41/14 ; F02M25/07

Abstract:
A contact-type infrared temperature sensor 1 for high temperature measurement is provided with: a heat-resistant cylindrical member 2, having a cylindrical shape with one end as a closed section 21 and the other end as an open section 22; an infrared temperature detecting member 4, disposed facing and spaced from the closed section 21, and including no infrared filter; and an optical function section 33, having an infrared light inlet 31 disposed facing and spaced from the closed section 21 by a predetermined dimension, restricting infrared light radiated from the region spaced between the temperature-sensitive section and the infrared light inlet by the predetermined dimension to a range of the region by the infrared light inlet 31 and guiding the infrared light to the infrared temperature detecting member 4.
Public/Granted literature
- US20150219000A1 CONTACT-TYPE INFRARED TEMPERATURE SENSOR, THERMAL APPARATUS, AND EXHAUST SYSTEM Public/Granted day:2015-08-06
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