Invention Grant
- Patent Title: Optical subassembly testing system
- Patent Title (中): 光学组件测试系统
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Application No.: US14510352Application Date: 2014-10-09
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Publication No.: US09273993B2Publication Date: 2016-03-01
- Inventor: Chang-Wei Kuo
- Applicant: HON HAI PRECISION INDUSTRY CO., LTD.
- Applicant Address: TW New Taipei
- Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee: HON HAI PRECISION INDUSTRY CO., LTD.
- Current Assignee Address: TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: TW102139449A 20131031
- Main IPC: G01J1/00
- IPC: G01J1/00

Abstract:
An optical subassembly testing system includes a pedestal, a rotation device, a holder and a supporting device. The rotation device includes a rotation member, a connecting plate and a retractable pillar. The rotation member is arranged on the pedestal and rotates relative to the pedestal. The connecting plate includes a mounting portion and a protruding portion, the mounting portion is arranged on the rotation member, the protruding portion extends away from the mounting portion and is exposed outside of the rotation member, and the retractable pillar is fixed perpendicular to the pedestal on an end of the protruding portion. The holder is fixed on an end of the retractable pillar and clamps a fiber connector. The supporting device includes a plurality of receiving grooves surrounding the pedestal, the receiving grooves are configured for receiving transmitter optical subassemblies (TOSAs) to test by aligning the fiber connector with each TOSA in turn.
Public/Granted literature
- US20150117855A1 OPTICAL SUBASSEMBLY TESTING SYSTEM Public/Granted day:2015-04-30
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