Invention Grant
US09274000B2 Tunable light source system with wavelength measurement for a hyper-spectral imaging system
有权
可调谐光源系统，具有超光谱成像系统的波长测量
- Patent Title: Tunable light source system with wavelength measurement for a hyper-spectral imaging system
- Patent Title (中): 可调谐光源系统，具有超光谱成像系统的波长测量
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Application No.: US14360999Application Date: 2012-11-29
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Publication No.: US09274000B2Publication Date: 2016-03-01
- Inventor: Cameron John Tovey
- Applicant: CORNING INCORPORATED
- Applicant Address: US NY Corning
- Assignee: Corning Incorporated
- Current Assignee: Corning Incorporated
- Current Assignee Address: US NY Corning
- Agent John L. Haack
- International Application: PCT/US2012/067040 WO 20121129
- International Announcement: WO2013/082272 WO 20130606
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J9/00 ; G01J3/433 ; G01N21/77 ; H04N5/235 ; G01J3/12
Abstract:
A tunable light source system with wavelength measurement capability for a hyper-spectral imaging system is disclosed. A method includes reference filtering a portion of a tunable light beam while tuning the center wavelength, detecting with at least one photodetector the reference-filtered tunable light beam and generating therefrom at least one detector signal that varies with the center wavelength, and determining a tunable center wavelength based on the at least one detector signal.
Public/Granted literature
- US20140327816A1 TUNABLE LIGHT SOURCE SYSTEM WITH WAVELENGTH MEASUREMENT FOR A HYPER-SPECTRAL IMAGING SYSTEM Public/Granted day:2014-11-06
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