Material classification for a sample fabricated from an unknown material, particularly a specular sample such as a metallic sample fabricated from an unknown metal. A measurement is obtained of a specular reflection of the sample at at least one observation angle and in at least two spectral bands including first and second spectral bands; a feature vector is calculated using a homogeneous function that combines the measured specular reflections in the first and second spectral bands; and the sample is classified based on the feature vector. The homogeneous function may include a ratio of values of the first and second spectral bands of the measured specular reflections, and the feature vector may be based on a histogram of such ratio values. Classification may include determining a distance between the feature vector of the sample and a feature vector of a reference sample in a predetermined database of labeled samples.