Invention Grant
- Patent Title: Method and apparatus for investigating a sample with regard to the lifetime of an excited state
- Patent Title (中): 关于激发态的寿命的样品的调查方法和装置
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Application No.: US14401952Application Date: 2013-04-19
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Publication No.: US09274057B2Publication Date: 2016-03-01
- Inventor: Juergen Schneider , Bernd Widzgowski , Jochen Sieber , Wernher Fouquet , Lars Friedrich , Arnold Giske , Lioba Kuschel
- Applicant: Leica Microsystems CMS GmbH
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Pantentbar International, P.C.
- Priority: DE102012009780 20120518
- International Application: PCT/EP2013/058195 WO 20130419
- International Announcement: WO2013/171024 WO 20131121
- Main IPC: G01N21/64
- IPC: G01N21/64 ; G02B21/00

Abstract:
The invention relates to a method for investigating a sample with regard to the lifetime of an excited state, in particular a fluorescence lifetime, and/or with regard to a property of a sample which is correlated with a lifetime of an excited state, in particular with a fluorescence lifetime, a sample region being illuminated with a sequence of excitation light pulses. The method is characterized in that the light quantity and/or number of photons of the detected light, in particular fluorescent light, proceeding from the sample region is measured temporally between the excitation light pulses exclusively within a detection time window in each case, at least two detection time windows having different temporal lengths.
Public/Granted literature
- US20150123013A1 Method and Apparatus for Investigating a Sample with Regard to the Lifetime of an Excited State Public/Granted day:2015-05-07
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