Invention Grant
- Patent Title: Magnetic field measurement apparatus
- Patent Title (中): 磁场测量装置
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Application No.: US13614610Application Date: 2012-09-13
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Publication No.: US09274182B2Publication Date: 2016-03-01
- Inventor: Hitoshi Ueno , Kimio Nagasaka
- Applicant: Hitoshi Ueno , Kimio Nagasaka
- Applicant Address: JP
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: JP2011-229036 20111018
- Main IPC: G01R33/00
- IPC: G01R33/00 ; G01R33/032

Abstract:
A magnetic field measurement apparatus includes an irradiation portion, a gas cell, a measurement unit (polarization separation unit, light receiving portion, signal processing circuit), and a magnetic shield. The magnetic shield is formed in a elongated hollow shape having openings at both sides thereof. The gas cell, in which gaseous atoms are sealed, is disposed in a hollow area of the magnetic shield. The irradiation portion irradiates irradiation light including linearly polarized light adjusted so that the vibration direction of an electric field coincides with the axis direction of the magnetic shield onto the gaseous atoms sealed in the gas cell along a direction perpendicular to the axis of the magnetic shield. The measurement unit measures a rotational angle of a polarization plane of the irradiation light that has been irradiated by the irradiation portion and passed through the gaseous atoms.
Public/Granted literature
- US20130093421A1 MAGNETIC FIELD MEASUREMENT APPARATUS Public/Granted day:2013-04-18
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