Invention Grant
US09274711B2 Skewing expected wearout times of memory devices 有权
倾斜预期的存储设备的疲劳时间

Skewing expected wearout times of memory devices
Abstract:
Aspects of the present invention include a system, method, and computer program product for skewing expected wearout times of memory devices in an array are provided according to some embodiments of the present invention. In general, the method includes determining or receiving an amount of spare space to provide in an array of memory devices, allocating the spare space non-uniformly to the memory devices in the array, and skewing expected wearout times of the memory devices by controlling writing of data to the array according to the allocation of the spare space.
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