Invention Grant
- Patent Title: Scan parameter policy
- Patent Title (中): 扫描参数策略
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Application No.: US13503173Application Date: 2010-10-19
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Publication No.: US09275189B2Publication Date: 2016-03-01
- Inventor: Matthew J. Walker , Mark E. Olszewski
- Applicant: Matthew J. Walker , Mark E. Olszewski
- Applicant Address: NL Eindhoven
- Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee: KONINKLIJKE PHILIPS N.V.
- Current Assignee Address: NL Eindhoven
- International Application: PCT/IB2010/054732 WO 20101019
- International Announcement: WO2011/048547 WO 20110428
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06F19/00 ; A61B6/03 ; A61B6/10
Abstract:
A computing apparatus includes a processor (212) that evaluates at least one scan parameter of a scan protocol selected for scanning a subject with an imaging system (102) based on a corresponding scan parameter policy and generates a signal indicative of whether the scan parameter satisfies the scan parameter policy.
Public/Granted literature
- US20120213326A1 SCAN PARAMETER POLICY Public/Granted day:2012-08-23
Information query
