Invention Grant
- Patent Title: Semiconductor test device and method of generating address scramble using the same
- Patent Title (中): 半导体测试装置及其使用方法产生地址加扰
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Application No.: US13666273Application Date: 2012-11-01
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Publication No.: US09275756B2Publication Date: 2016-03-01
- Inventor: Jin Taek Oh
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-Do
- Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee: SAMSUNG ELECTRONICS CO., LTD.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, PLC
- Priority: KR10-2011-0113968 20111103
- Main IPC: G11C29/00
- IPC: G11C29/00 ; G11C29/10 ; G11C29/18

Abstract:
The method of generating an address scramble includes receiving address information for each of a plurality of memory cells included in a semiconductor memory device and the address information that includes a logical address and a physical address corresponding to each of the memory cells; generating an address scramble logical expression, the address scramble logical expression relating logical addresses to physical addresses based on the address information; and reducing the address scramble logical expression using a given algorithm.
Public/Granted literature
- US20130117617A1 SEMICONDUCTOR TEST DEVICE AND METHOD OF GENERATING ADDRESS SCRAMBLE USING THE SAME Public/Granted day:2013-05-09
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