Invention Grant
US09275756B2 Semiconductor test device and method of generating address scramble using the same 有权
半导体测试装置及其使用方法产生地址加扰

Semiconductor test device and method of generating address scramble using the same
Abstract:
The method of generating an address scramble includes receiving address information for each of a plurality of memory cells included in a semiconductor memory device and the address information that includes a logical address and a physical address corresponding to each of the memory cells; generating an address scramble logical expression, the address scramble logical expression relating logical addresses to physical addresses based on the address information; and reducing the address scramble logical expression using a given algorithm.
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