Invention Grant
US09275886B2 Device and method for detecting position of semiconductor substrate
有权
用于检测半导体衬底位置的装置和方法
- Patent Title: Device and method for detecting position of semiconductor substrate
- Patent Title (中): 用于检测半导体衬底位置的装置和方法
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Application No.: US14438189Application Date: 2013-10-23
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Publication No.: US09275886B2Publication Date: 2016-03-01
- Inventor: Keiji Fujimoto , Yasuharu Yamamoto
- Applicant: RORZE CORPORATION
- Applicant Address: JP
- Assignee: Rorze Corporation
- Current Assignee: Rorze Corporation
- Current Assignee Address: JP
- Agency: Merek, Blackmon & Voorhees, LLC
- Priority: JP2012-238373 20121029
- International Application: PCT/JP2013/078644 WO 20131023
- International Announcement: WO2014/069291 WO 20140508
- Main IPC: G06K9/00
- IPC: G06K9/00 ; H01L21/68 ; G01B11/00 ; H01L21/67 ; G06T7/00

Abstract:
Provided is a position detecting device that is capable of precisely detecting the coordinates of the center of a disc-shaped substrate from image data captured by one camera, calculating the amount of positional misalignment of the disc-shaped substrate on a support member as the disc-shaped substrate is being transported during processing, and correcting the position such that the substrate can be located at the precise loading position. Isosceles right triangles, each having the radius of the disc-shaped substrate as one side, are generated from the coordinates of two places on edge data extracted from the image data and the radius on the edge data, and the coordinates of the center position of the disc-shaped substrate are detected by using the Pythagorean theorem.
Public/Granted literature
- US20150287625A1 DEVICE AND METHOD FOR DETECTING POSITION OF SEMICONDUCTOR SUBSTRATE Public/Granted day:2015-10-08
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