Invention Grant
US09275967B2 Protrusion bump pads for bond-on-trace processing 有权
用于跟踪跟踪处理的突起凸块

Protrusion bump pads for bond-on-trace processing
Abstract:
A die and a substrate are provided. The die comprises at least one integrated circuit chip, and the substrate comprises first and second subsets of conductive pillars extending at least partially therethrough. Each of the first subset of conductive pillars comprises a protrusion bump pad protruding from a surface of the substrate, and the second subset of conductive pillars each partially form a trace recessed within the surface of the substrate. The die is coupled to the substrate via a plurality of conductive bumps each extending between one of the protrusion bump pads and the die.
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