Invention Grant
- Patent Title: Protrusion bump pads for bond-on-trace processing
- Patent Title (中): 用于跟踪跟踪处理的突起凸块
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Application No.: US14148482Application Date: 2014-01-06
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Publication No.: US09275967B2Publication Date: 2016-03-01
- Inventor: Yu-Min Liang , Jiun-Yi Wu
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L23/00
- IPC: H01L23/00 ; H01L23/48 ; H01L21/66

Abstract:
A die and a substrate are provided. The die comprises at least one integrated circuit chip, and the substrate comprises first and second subsets of conductive pillars extending at least partially therethrough. Each of the first subset of conductive pillars comprises a protrusion bump pad protruding from a surface of the substrate, and the second subset of conductive pillars each partially form a trace recessed within the surface of the substrate. The die is coupled to the substrate via a plurality of conductive bumps each extending between one of the protrusion bump pads and the die.
Public/Granted literature
- US20150194404A1 Protrusion Bump Pads for Bond-on-Trace Processing Public/Granted day:2015-07-09
Information query
IPC分类: