Invention Grant
- Patent Title: Scalable and reliable non-volatile memory cell
- Patent Title (中): 可扩展和可靠的非易失性存储单元
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Application No.: US14210379Application Date: 2014-03-13
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Publication No.: US09276206B2Publication Date: 2016-03-01
- Inventor: Shyue Seng Tan , Eng Huat Toh
- Applicant: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Applicant Address: SG Singapore
- Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee: GLOBALFOUNDRIES Singapore Pte. Ltd.
- Current Assignee Address: SG Singapore
- Agency: Horizon IP Pte. Ltd.
- Main IPC: H01L29/788
- IPC: H01L29/788 ; H01L45/00 ; H01L27/24 ; H01L29/423 ; H01L29/66 ; H01L27/115

Abstract:
Devices and methods for forming a device are disclosed. The method includes providing a substrate and forming a memory cell pair on the substrate. Each of a memory cell of the memory cell pair includes at least one transistor having first and second gates formed between first and second terminals and a third gate disposed over the second terminal. The first gate serves as an access gate (AG), the second gate serves as a storage gate and the third gate serves as an erase gate (EG). The first cell terminal serves as a bitline terminal and the second cell terminal serves as a source line terminal. The source line terminal is a raised source line terminal and is elevated with respect to the bit line terminal and the source line terminal is common to the memory cell pair.
Public/Granted literature
- US20140264540A1 SCALABLE AND RELIABLE NON-VOLATILE MEMORY CELL Public/Granted day:2014-09-18
Information query
IPC分类: