Invention Grant
- Patent Title: Circuit and method for calibration of analog-to-digital converter
- Patent Title (中): 用于模数转换器校准的电路和方法
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Application No.: US14618263Application Date: 2015-02-10
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Publication No.: US09276597B1Publication Date: 2016-03-01
- Inventor: Wen-Hua Chang
- Applicant: MediaTek Inc.
- Applicant Address: TW Hsin-Chu
- Assignee: MEDIATEK INC.
- Current Assignee: MEDIATEK INC.
- Current Assignee Address: TW Hsin-Chu
- Agency: McClure, Qualey & Rodack, LLP
- Main IPC: H03M1/06
- IPC: H03M1/06 ; H03M1/10 ; H03M1/36

Abstract:
An analog-to-digital converter is provided. Each pre-amplifier provides a pair of differential outputs according to a pair of differential analog input signals and a first reference voltage and a second reference voltage from a resistor chain, wherein the first reference voltage is different from the second reference voltage. Each dynamic comparator provides a first comparing signal and a second comparing signal according to the pair of differential outputs of the pre-amplifier. Each pre-amplifier includes a first calibration unit for calibrating a first offset voltage from the pre-amplifier at the pair of differential outputs at a specific temperature, and a second calibration unit for calibrating a second offset voltage from the corresponding dynamic comparator at the pair of differential outputs.
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