Invention Grant
- Patent Title: System and method for setting up secondary reflective optic
- Patent Title (中): 用于设置二次反光镜的系统和方法
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Application No.: US13803313Application Date: 2013-03-14
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Publication No.: US09279658B1Publication Date: 2016-03-08
- Inventor: Steven Paul Maffett , Andrew VanAuken , Cormic Merle
- Applicant: Exelis Inc.
- Applicant Address: US VA Herndon
- Assignee: Exelis, Inc.
- Current Assignee: Exelis, Inc.
- Current Assignee Address: US VA Herndon
- Agency: RatnerPrestia
- Main IPC: G01B11/00
- IPC: G01B11/00 ; G01B9/02 ; G02B21/26 ; G02B7/00

Abstract:
An apparatus for testing an optical test piece comprising an interferometer for emitting an incident light beam. The apparatus includes a first reflective optic that receives the incident beam and produces a first reflected beam by focusing and expanding the received incident beam. The apparatus also includes a second reflective optic that receives and collimates the first reflected beam and outputs the collimated beam toward the optical test piece. Both the first and the second reflective optics are fixed to their respective positions relative to a thermally insensitive platform and the optical test piece is docked to the thermally insensitive platform and can be removed.
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