Invention Grant
- Patent Title: Device for measuring slab thickness
- Patent Title (中): 板厚测量装置
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Application No.: US14125738Application Date: 2012-06-15
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Publication No.: US09279664B2Publication Date: 2016-03-08
- Inventor: Michel Dussud , Fabien Dejean
- Applicant: Michel Dussud , Fabien Dejean
- Applicant Address: FR Saint Symphorien sur Coise
- Assignee: AVEMIS S.A.S.
- Current Assignee: AVEMIS S.A.S.
- Current Assignee Address: FR Saint Symphorien sur Coise
- Agent Thomas Clinton; Donald M. Satina
- Priority: FR1155281 20110616
- International Application: PCT/EP2012/002548 WO 20120615
- International Announcement: WO2012/171658 WO 20121220
- Main IPC: B22D41/08
- IPC: B22D41/08 ; G01B11/06 ; B22D11/18 ; G01B21/08 ; G01F23/24 ; B22D46/00 ; C21C5/46 ; C21C5/52

Abstract:
A device for measuring the thickness of slag on the surface of liquid metal contained in an ingot mould comprises a wire made of electrically conductive material and capable of being eliminated under the effect of the heat at the temperature of the slag, the wire having a free end able to be dipped into the slag, a wire feeder capable of displacing the wire so that its free end dips vertically into the slag according to a predetermined trajectory, a wire displacement measurer capable of measuring a distance travelled by the free end of the wire during a time interval between two predetermined events when the latter is displaced under the action of the feeding means, and a wire feeder controller having a molten metal contact detector capable of detecting contact between the free end and the surface of the liquid metal.
Public/Granted literature
- US20140131002A1 DEVICE FOR MEASURING SLAB THICKNESS Public/Granted day:2014-05-15
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