Invention Grant
- Patent Title: Circuit and measuring system
- Patent Title (中): 电路和测量系统
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Application No.: US14154995Application Date: 2014-01-14
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Publication No.: US09279702B2Publication Date: 2016-03-08
- Inventor: Joachim Ritter , Joerg Franke
- Applicant: Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: DE102013000431 20130114
- Main IPC: G01B7/30
- IPC: G01B7/30 ; G01R33/09 ; G01D5/16 ; G01D5/14 ; G01R33/07

Abstract:
A measuring system having a first magnetic field sensor, a second magnetic field sensor, an encoder, and an evaluation circuit to which the first magnetic field sensor and the second magnetic field sensor are connected. The evaluation circuit generates a first signal and a second measurement signal. The encoder generates a second magnetic field change with a second periodicity. The evaluation circuit generates a second signal with the second periodicity from the first measurement signal of the first magnetic field sensor and the second measurement signal of the second magnetic field sensor according to an absolute value function.
Public/Granted literature
- US20140197822A1 CIRCUIT AND MEASURING SYSTEM Public/Granted day:2014-07-17
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