Invention Grant
- Patent Title: Method for identifying a crystallographic candidate phase of a crystal
- Patent Title (中): 用于识别晶体的晶体候选相的方法
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Application No.: US14621580Application Date: 2015-02-13
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Publication No.: US09279779B2Publication Date: 2016-03-08
- Inventor: Thomas Schwager
- Applicant: Bruker Nano GmbH
- Applicant Address: DE Berlin
- Assignee: BRUKER NANO GMBH
- Current Assignee: BRUKER NANO GMBH
- Current Assignee Address: DE Berlin
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: DE102014203090 20140220
- Main IPC: H01J37/26
- IPC: H01J37/26 ; G01N23/207 ; G01N23/203

Abstract:
According to the invention a method is provided for identifying a crystallographic candidate phase of a crystal in an EBSD diffraction pattern, which includes the following steps: Sorting and indexing of the bands of the diffraction pattern in order of decreasing intensity. Providing of indices of the diffraction bands of candidate phases, which are to be expected as a result of the EBSD pattern acquisition, in a database, wherein all the indices provided can, in each case, be assigned to a candidate phase. Identification of the expected bands with the bands measured in the diffraction pattern for each candidate phase. Comparison of the intensities of bands of the measured diffraction pattern with intensities which were predicted for the diffraction bands of the candidate phases, which are to be expected as a result of the EBSD pattern acquisition, the indices of said candidate phases being stored in the database. In addition, a corresponding computer program and a computer-readable storage medium are provided, on which a computer program according to the invention is stored.
Public/Granted literature
- US20150233843A1 METHOD FOR IDENTIFYING A CRYSTALLOGRAPHIC CANDIDATE PHASE OF A CRYSTAL Public/Granted day:2015-08-20
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