Invention Grant
- Patent Title: Method of and an apparatus conducting calibration for phased-array shear wave channels inspecting square bars
- Patent Title (中): 对相位阵列剪切波通道进行校准的方法和装置检查方棒
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Application No.: US13591893Application Date: 2012-08-22
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Publication No.: US09279786B2Publication Date: 2016-03-08
- Inventor: Jinchi Zhang
- Applicant: Jinchi Zhang
- Applicant Address: US MA Waltham
- Assignee: OLYMPUS NDT
- Current Assignee: OLYMPUS NDT
- Current Assignee Address: US MA Waltham
- Agency: Ostrolenk Faber LLP
- Main IPC: G01N29/00
- IPC: G01N29/00 ; G01N29/26 ; G01N29/04 ; G01N29/27

Abstract:
Disclosed is a system and method suitable for calibrating a phased array system configured to inspect square bars. A square bar is provided with an array of parallel linear notches across the full range of the testing surface of the square bar for this calibrating purpose. The square bar is passed through the probe in probe's passive direction during the calibration. The phased array system is adjusted and calibrated so that the echo amplitude for each inspection channel of the phased array probe received from each notch is substantially equal. Then a known flaw with a typically expected flaw's size and shape is created on the same testing surface so that the system's sensitivity is adjusted using the amplitude of the echo signal from the known flaw as a baseline.
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