Invention Grant
- Patent Title: Sample fixing member for atomic force microscope
- Patent Title (中): 原子力显微镜样品固定件
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Application No.: US14374733Application Date: 2013-01-29
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Publication No.: US09279828B2Publication Date: 2016-03-08
- Inventor: Youhei Maeno , Yoshinori Suzuki
- Applicant: NITTO DENKO CORPORATION
- Applicant Address: JP Osaka
- Assignee: NITTO DENKO CORPORATION
- Current Assignee: NITTO DENKO CORPORATION
- Current Assignee Address: JP Osaka
- Agency: Sughrue Mion, PLLC
- Priority: JP2012-021711 20120203
- International Application: PCT/JP2013/051804 WO 20130129
- International Announcement: WO2013/115144 WO 20130808
- Main IPC: G01Q30/20
- IPC: G01Q30/20 ; C01B31/02 ; G01Q60/24 ; B82Y15/00
Abstract:
Provided is a sample fixing member for an atomic force microscope capable of reducing the drift amount of a sample during measurement. A sample fixing member for an atomic force microscope of the present invention includes a fibrous columnar structure including a plurality of fibrous columnar objects each having a length of 200 μm or more.
Public/Granted literature
- US20150013036A1 SAMPLE FIXING MEMBER FOR ATOMIC FORCE MICROSCOPE Public/Granted day:2015-01-08
Information query
