Invention Grant
US09279830B2 Test probe structures and methods including positioning test probe structures in a test head
有权
测试探头结构和方法，包括在测试头中定位测试探头结构
- Patent Title: Test probe structures and methods including positioning test probe structures in a test head
- Patent Title (中): 测试探头结构和方法，包括在测试头中定位测试探头结构
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Application No.: US13976448Application Date: 2011-12-31
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Publication No.: US09279830B2Publication Date: 2016-03-08
- Inventor: Roy E. Swart , Warren S. Crippen , Charlotte C. Kwong , David Shia
- Applicant: Roy E. Swart , Warren S. Crippen , Charlotte C. Kwong , David Shia
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Konrad Raynes Davda & Victor LLP
- Agent Alan S. Raynes
- International Application: PCT/US2011/068271 WO 20111231
- International Announcement: WO2013/101238 WO 20130704
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R1/067 ; G01R1/073 ; G01R3/00
Abstract:
The formation of test probe structures is described. One test probe structure includes a tip portion and a handle portion spaced a distance away from the tip portion. The test probe structure also includes a body bend portion positioned between the tip portion and the handle portion, and an intermediate portion positioned between the body bend portion and the handle portion. The body bend portion may include a curved shape extending from the intermediate portion to the tip portion. The tip portion may be formed to be offset from a longitudinal axis defined by the intermediate portion. The test probe structure defines a length and includes a cross-sectional area that is different at a plurality of positions along the length. Other embodiments are described and claimed.
Public/Granted literature
- US20140239995A1 TEST PROBES Public/Granted day:2014-08-28
Information query
